Welcome to the
Post Orlando 2010 Web Site

The 45th Meeting of the International Committee of Legal Metrology took place at the DoubleTree Hotel, Orlando (Florida), United States, from Tuesday 21 through Friday 24 September 2010, and a Regional Legal Metrology Organization meeting took place on Monday 20 September.

In the table below we publish or provide links to the Resolutions and other documents,
presentations and reports following the meeting.

OIML Related Documents / Information		Other Documents / Information
45th CIML Meeting Minutes		Presentations on metrology in the USA
45th CIML Meeting Resolutions		NASA Presentations
45th CIML Meeting Attendance List		ILAC/IAF presentation
45th CIML Meeting Group photo		CECIP presentation
OIML Awards		BIPM Report
Progress on the Revision of OIML D 1
OIML Liaisons
Comments on Conformity to Type (CTT)
Revision of the Directives - CIML comments and BIML responses
Presentations by the Facilitator for Developing Country Matters
Invitation by CIML President Mr. Alan E. Johnston